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Xylan characterization by ft-ir

  • At: Salvadore (Brazil) (2006)
  • Type: Poster
  • By: ELEAMEN, Elquio (UFRN, Natal, Brazil)
  • Co-author(s): Silva, Acarília (UFRN, NATAL, Brazil)
    Nagashima, Toshiyuki (UFRN, NATAL, Brazil)
    Araujo, Ivonete (UFRN, NATAL, Brazil)
    Verissimo, Lourena (UFRN, NATAL, Brazil)
    Egito, E. Sócrates (UFRN, NATAL, Brazil)
  • Abstract:

    FT-IR spectroscopy is a rapid and sensitive tool for structural elucidation and identification of several substances. Xylan, a polysaccharide found in a variety of cell wall plants, presents a relatively complex structure, which varies according to its source. In this study, infrared spectra were used in order to identify its structural..

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Last update 4 October 2019

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